106 lines
2.8 KiB
C
106 lines
2.8 KiB
C
/* SPDX-License-Identifier: GPL-2.0 */
|
|
/* Copyright (C) 2019 ARM Limited */
|
|
|
|
#ifndef __TEST_SIGNALS_H__
|
|
#define __TEST_SIGNALS_H__
|
|
|
|
#include <signal.h>
|
|
#include <stdbool.h>
|
|
#include <ucontext.h>
|
|
|
|
/*
|
|
* Using ARCH specific and sanitized Kernel headers from the tree.
|
|
*/
|
|
#include <asm/ptrace.h>
|
|
#include <asm/hwcap.h>
|
|
|
|
#define __stringify_1(x...) #x
|
|
#define __stringify(x...) __stringify_1(x)
|
|
|
|
#define get_regval(regname, out) \
|
|
{ \
|
|
asm volatile("mrs %0, " __stringify(regname) \
|
|
: "=r" (out) \
|
|
: \
|
|
: "memory"); \
|
|
}
|
|
|
|
/*
|
|
* Feature flags used in tdescr.feats_required to specify
|
|
* any feature by the test
|
|
*/
|
|
enum {
|
|
FSSBS_BIT,
|
|
FSVE_BIT,
|
|
FSME_BIT,
|
|
FSME_FA64_BIT,
|
|
FMAX_END
|
|
};
|
|
|
|
#define FEAT_SSBS (1UL << FSSBS_BIT)
|
|
#define FEAT_SVE (1UL << FSVE_BIT)
|
|
#define FEAT_SME (1UL << FSME_BIT)
|
|
#define FEAT_SME_FA64 (1UL << FSME_FA64_BIT)
|
|
|
|
/*
|
|
* A descriptor used to describe and configure a test case.
|
|
* Fields with a non-trivial meaning are described inline in the following.
|
|
*/
|
|
struct tdescr {
|
|
/* KEEP THIS FIELD FIRST for easier lookup from assembly */
|
|
void *token;
|
|
/* when disabled token based sanity checking is skipped in handler */
|
|
bool sanity_disabled;
|
|
/* just a name for the test-case; manadatory field */
|
|
char *name;
|
|
char *descr;
|
|
unsigned long feats_required;
|
|
unsigned long feats_incompatible;
|
|
/* bitmask of effectively supported feats: populated at run-time */
|
|
unsigned long feats_supported;
|
|
bool initialized;
|
|
unsigned int minsigstksz;
|
|
/* signum used as a test trigger. Zero if no trigger-signal is used */
|
|
int sig_trig;
|
|
/*
|
|
* signum considered as a successful test completion.
|
|
* Zero when no signal is expected on success
|
|
*/
|
|
int sig_ok;
|
|
/* signum expected on unsupported CPU features. */
|
|
int sig_unsupp;
|
|
/* a timeout in second for test completion */
|
|
unsigned int timeout;
|
|
bool triggered;
|
|
bool pass;
|
|
unsigned int result;
|
|
/* optional sa_flags for the installed handler */
|
|
int sa_flags;
|
|
ucontext_t saved_uc;
|
|
/* used by get_current_ctx() */
|
|
size_t live_sz;
|
|
ucontext_t *live_uc;
|
|
volatile sig_atomic_t live_uc_valid;
|
|
/* optional test private data */
|
|
void *priv;
|
|
|
|
/* a custom setup: called alternatively to default_setup */
|
|
int (*setup)(struct tdescr *td);
|
|
/* a custom init: called by default test init after test_setup */
|
|
bool (*init)(struct tdescr *td);
|
|
/* a custom cleanup function called before test exits */
|
|
void (*cleanup)(struct tdescr *td);
|
|
/* an optional function to be used as a trigger for starting test */
|
|
int (*trigger)(struct tdescr *td);
|
|
/*
|
|
* the actual test-core: invoked differently depending on the
|
|
* presence of the trigger function above; this is mandatory
|
|
*/
|
|
int (*run)(struct tdescr *td, siginfo_t *si, ucontext_t *uc);
|
|
/* an optional function for custom results' processing */
|
|
void (*check_result)(struct tdescr *td);
|
|
};
|
|
|
|
extern struct tdescr tde;
|
|
#endif
|